• X-ray source with polycapillary optics for spot sizes below 40 µm
  • 20 to 50 times better sensitivity for heavier elements compared to e-beam excitation enables trace element detection
  • Enhanced analytical accuracy through combination of quantitative results from both electron and X-ray induced spectra
  • Fully integrated in ESPRIT 2, our new 4-in-1 software


Someone has to be first.

To the QUANTAX Micro-XRF product page

Focused in to 40 µm.

Focused in from 400 meters.

XTrace, our micro-spot X-ray source adds Micro-XRF analysis capability to the SEM.